Showing results: 16 - 27 of 27 items found.
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AFSEM® AFM Insert -
Quantum Design Inc.
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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FM-Nanoview 6800 -
Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
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HORIBA, Ltd.
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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MK52 Series -
Kinetic Systems, Inc.
Providing Ultra-Low Frequency levels, the MK52 Series offers the ultimate low natural frequency performance for a wide range of high resolution instruments, such as analytical balances, cell injection, confocal microscopes, patch clamping, optical microscopes, wafer probing, sensor calibration, atomic force microscopes and other sensitive equipment requiring high isolation efficiency.
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Neaspec GmbH
Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time
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VLSI Standards, Inc.
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
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VLSI Standards, Inc.
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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VLSI Standards, Inc.
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Dimension FastScan Bio -
Bruker Optics
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Bruker Nano Surfaces
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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AEP Technology
AEP Technology offers unique nanomechanical testers with a variety of interchangeable test heads that allow nanoindentation, scratch testing, microindentation testing and abrasion testing to be performed on the same platform. The rugged platform with built-in high-resolution imaging systems (atomic force microscope, 3D profiler, etc.) makes the UNT-30 a powerful tool for R&D and production. In order to ensure the high reliability of the data, the tester is also equipped with a shockproof platform and a soundproof cover.
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AEP Technology
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
